Knowledge-Driven Board-Level Functional Fault Diagnosis

• Κύριοι συγγραφείς: Ye, Fangming (Συγγραφέας), Zhang, Zhaobo (Συγγραφέας), Chakrabarty, Krishnendu (Συγγραφέας), Gu, Xinli (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Θέματα: Engineering.; Data mining.; Electronics.; Microelectronics.; Electronic circuits.; Circuits and Systems.; Data Mining and Knowledge Discovery.; Electronics and Microelectronics, Instrumentation.

This book provides a comprehensive set of characterization, prediction, optimization, evaluation, and evolution techniques for a diagnosis system for fault isolation in large electronic systems. Readers with a background in electronics design or system engineering can use this book as a reference to...