Nanoscale AFM and TEM Observations of Elementary Dislocation Mechanisms

• Κύριος συγγραφέας: Veselý, Jozef (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Σειρά: Springer Theses, Recognizing Outstanding Ph.D. Research,
• Θέματα: Physics.; Condensed matter.; Spectroscopy.; Microscopy.; Materials science.; Spectroscopy and Microscopy.; Characterization and Evaluation of Materials.; Condensed Matter Physics.; Numerical and Computational Physics, Simulation.

This thesis addresses elementary dislocation processes occurring in single-crystalline alloys based on Fe-Al, and investigates correspondences between dislocation distribution inside crystals characterized by transmission electron microscopy (TEM) and surface patterns observed using atomic force mic...