Charge-Trapping Non-Volatile Memories Volume 2--Emerging Materials and Structures /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Dimitrakis, Panagiotis (Editor)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Subjects: Materials science.; Computer memory systems.; Electronic circuits.; Electronics.; Microelectronics.; Engineering > Materials.; Nanotechnology.; Materials Science.; Electronic Circuits and Devices.; Electronics and Microelectronics, Instrumentation.; Memory Structures.; Materials Engineering.

 This book describes the technology of charge-trapping non-volatile memories and their uses. The authors explain the device physics of each device architecture and provide a concrete description of the materials involved and the fundamental properties of the technology. Modern material properties, used as charge-trapping layers, for new applications are introduced. Provides a comprehensive overview of the technology for charge-trapping non-volatile memories; Details new architectures and current modeling concepts for non-volatile memory devices; Focuses on conduction through multi-layer gate dielectrics stacks. 

 Materials and Device Reliability in SONOS Memories -- Charge-Trap-Non-Volatile Memory and Focus on Flexible Flash Memory Devices -- Hybrid Memories Based on Redox Molecules -- Organic Floating-Gate Memory Structures -- Nanoparticles Based Flash-like Non Volatile Memories: Cluster Beam Synthesis of Metallic Nanoparticles and Challenges for the Overlying Control Oxide Layer.