Posser, G., Sapatnekar, S. S., & Reis, R. (2017). Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Springer International Publishing : Imprint: Springer.
Παραπομπή σε μορφή Chicago (17η εκδ.)Posser, Gracieli, Sachin S. Sapatnekar, και Ricardo Reis. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Cham: Springer International Publishing : Imprint: Springer, 2017.
Παραπομπή σε μορφή MLA (8th εκδ.)Posser, Gracieli, et al. Electromigration Inside Logic Cells: Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS. Springer International Publishing : Imprint: Springer, 2017.
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