Electromigration Inside Logic Cells Modeling, Analyzing and Mitigating Signal Electromigration in NanoCMOS /

• Main Authors: Posser, Gracieli (Author), Sapatnekar, Sachin S. (Author), Reis, Ricardo (Author)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Subjects: Engineering.; Microprocessors.; Electronic circuits.; Circuits and Systems.; Electronic Circuits and Devices.; Processor Architectures.

This book describes new and effective methodologies for modeling, analyzing and mitigating cell-internal signal electromigration in nanoCMOS, with significant circuit lifetime improvements and no impact on performance, area and power. The authors are the first to analyze and propose a solution for t...

Table of Contents:

• Chapter 1. Introduction
• Chapter 2. State of the Art
• Chapter 3. Modeling Cell-internal EM
• Chapter 4. Current Calculation
• Chapter 5. Experimental Setup
• Chapter 6.Results
• Chapter 7. Analyzing the Electromigration Effects on Different Metal Layers
• Chapter 8. Conclusions.