Industrial X-Ray Computed Tomography

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Carmignato, Simone (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Dewulf, Wim (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Leach, Richard (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Θέματα: Materials science.; Manufactures.; Optical materials.; Electronic materials.; Atoms.; Physics.; Characterization and Evaluation of Materials.; Manufacturing, Machines, Tools, Processes.; Optical and Electronic Materials.; Atomic, Molecular, Optical and Plasma Physics.
• Φυσική περιγραφή: VII, 369 p. 273 illus. online resource.
• ISBN: 9783319595733
• DOI: 10.1007/978-3-319-59573-3

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students.