Industrial X-Ray Computed Tomography

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Carmignato, Simone (Editor, http://id.loc.gov/vocabulary/relators/edt), Dewulf, Wim (Editor, http://id.loc.gov/vocabulary/relators/edt), Leach, Richard (Editor, http://id.loc.gov/vocabulary/relators/edt)
Format: Electronic eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
Edition:1st ed. 2018.
Subjects:
Online Access:Full Text via HEAL-Link
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245 1 0 |a Industrial X-Ray Computed Tomography  |h [electronic resource] /  |c edited by Simone Carmignato, Wim Dewulf, Richard Leach. 
250 |a 1st ed. 2018. 
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300 |a VII, 369 p. 273 illus.  |b online resource. 
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505 0 |a Introduction -- Principles of X-ray computed tomography -- Technical concepts and components -- Processing and visualization of CT data -- Computer simulation -- Error sources -- Performance verification -- Traceability of CT dimensional measurements -- CT for non-destructive testing and materials characterization -- CT for dimensional metrology -- Other industrial applications. 
520 |a This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and software in both industry and academia, being also suitable for postgraduate students. 
650 0 |a Materials science. 
650 0 |a Manufactures. 
650 0 |a Optical materials. 
650 0 |a Electronic materials. 
650 0 |a Atoms. 
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