Industrial X-Ray Computed Tomography

• Corporate Author: SpringerLink (Online service)
• Other Authors: Carmignato, Simone (Editor, http://id.loc.gov/vocabulary/relators/edt), Dewulf, Wim (Editor, http://id.loc.gov/vocabulary/relators/edt), Leach, Richard (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Subjects: Materials science.; Manufactures.; Optical materials.; Electronic materials.; Atoms.; Physics.; Characterization and Evaluation of Materials.; Manufacturing, Machines, Tools, Processes.; Optical and Electronic Materials.; Atomic, Molecular, Optical and Plasma Physics.

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...