Industrial X-Ray Computed Tomography

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Carmignato, Simone (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Dewulf, Wim (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Leach, Richard (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Θέματα: Materials science.; Manufactures.; Optical materials.; Electronic materials.; Atoms.; Physics.; Characterization and Evaluation of Materials.; Manufacturing, Machines, Tools, Processes.; Optical and Electronic Materials.; Atomic, Molecular, Optical and Plasma Physics.

This book covers all aspects of industrial X-Ray computed tomography (XCT) including history, basics, different instrument architectures, hardware and software, error sources, traceability and calibration, and applications. The book is intended for users and developers of XCT instrumentation and sof...

Πίνακας περιεχομένων:

• Introduction
• Principles of X-ray computed tomography
• Technical concepts and components
• Processing and visualization of CT data
• Computer simulation
• Error sources
• Performance verification
• Traceability of CT dimensional measurements
• CT for non-destructive testing and materials characterization
• CT for dimensional metrology
• Other industrial applications.