Using Imperfect Semiconductor Systems for Unique Identification

• Κύριος συγγραφέας: Roberts, Jonathan (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2017.
• Σειρά: Springer Theses, Recognizing Outstanding Ph.D. Research,
• Θέματα: Physics.; Semiconductors.; System safety.; Optical materials.; Electronic materials.; Security Science and Technology.; Optical and Electronic Materials.

 This thesis describes novel devices for the secure identification of objects or electronic systems. The identification relies on the the atomic-scale uniqueness of semiconductor devices by measuring a macroscopic quantum property of the system in question. Traditionally, objects and electronic systems have been securely identified by measuring specific characteristics: common examples include passwords, fingerprints used to identify a person or an electronic device, and holograms that can tag a given object to prove its authenticity. Unfortunately, modern technologies also make it possible to circumvent these everyday techniques. Variations in quantum properties are amplified by the existence of atomic-scale imperfections. As such, these devices are the hardest possible systems to clone. They also use the least resources and provide robust security. Hence they have tremendous potential significance as a means of reliably telling the good guys from the bad. 

 An Introduction to Security Based on Physical Disorder -- An Introduction to Semiconductors and Quantum Confinement -- Sample Preparation and Experimental Techniques -- Unique Identification with Resonant Tunneling Diodes -- Langmuir-Blodgett Deposition of 2D Materials for Unique Identification -- Building Optoelectronic Heterostructures with the Langmuir-Blodgett Technique -- Conclusions and Future Work.