Ultra Low Noise CMOS Image Sensors

This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequent...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριος συγγραφέας: Boukhayma, Assim (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Σειρά:Springer Theses, Recognizing Outstanding Ph.D. Research,
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 03478nam a2200553 4500
001 978-3-319-68774-2
003 DE-He213
005 20191028121421.0
007 cr nn 008mamaa
008 171127s2018 gw | s |||| 0|eng d
020 |a 9783319687742  |9 978-3-319-68774-2 
024 7 |a 10.1007/978-3-319-68774-2  |2 doi 
040 |d GrThAP 
050 4 |a TK7800-8360 
050 4 |a TK7874-7874.9 
072 7 |a TJF  |2 bicssc 
072 7 |a TEC008000  |2 bisacsh 
072 7 |a TJF  |2 thema 
082 0 4 |a 621.381  |2 23 
100 1 |a Boukhayma, Assim.  |e author.  |4 aut  |4 http://id.loc.gov/vocabulary/relators/aut 
245 1 0 |a Ultra Low Noise CMOS Image Sensors   |h [electronic resource] /  |c by Assim Boukhayma. 
250 |a 1st ed. 2018. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2018. 
300 |a XIV, 180 p. 110 illus., 69 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
490 1 |a Springer Theses, Recognizing Outstanding Ph.D. Research,  |x 2190-5053 
505 0 |a Introduction -- Low-Noise CMOS Image Sensors -- Noise Sources and Mechanisms in CIS -- Detailed Noise Analysis in Low-Noise CMOS Image Sensors -- Noise Reduction in CIS Readout Chains -- Design of a Sub-electron Readout Noise Pixel in a Standard CIS Process -- Characterization of a Sub-electron Readout Noise VGA Imager in a Standard CIS Process -- A Passive Switched-Capacitor Circuit For Correlated Multiple Sampling -- Downscaling Effects Towards Photon Counting Capability in CIS -- An Ultra Low Noise CMOS THz Imager -- Conclusion. 
520 |a This thesis provides a thorough noise analysis for conventional CIS readout chains, while also presenting and discussing a variety of noise reduction techniques that allow the read noise in standard processes to be optimized. Two physical implementations featuring sub-0.5-electron RMS are subsequently presented to verify the proposed noise reduction techniques and provide a full characterization of a VGA imager. Based on the verified noise calculation, the impact of the technology downscaling on the input-referred noise is also studied. Further, the thesis covers THz CMOS image sensors and presents an original design that achieves ultra-low-noise performance. Last but not least, it provides a comprehensive review of CMOS image sensors. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
650 0 |a Signal processing. 
650 0 |a Image processing. 
650 0 |a Speech processing systems. 
650 0 |a Electronic circuits. 
650 1 4 |a Electronics and Microelectronics, Instrumentation.  |0 http://scigraph.springernature.com/things/product-market-codes/T24027 
650 2 4 |a Signal, Image and Speech Processing.  |0 http://scigraph.springernature.com/things/product-market-codes/T24051 
650 2 4 |a Circuits and Systems.  |0 http://scigraph.springernature.com/things/product-market-codes/T24068 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783319687735 
776 0 8 |i Printed edition:  |z 9783319687759 
776 0 8 |i Printed edition:  |z 9783319886572 
830 0 |a Springer Theses, Recognizing Outstanding Ph.D. Research,  |x 2190-5053 
856 4 0 |u https://doi.org/10.1007/978-3-319-68774-2  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)