Phase Change Memory Device Physics, Reliability and Applications /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Redaelli, Andrea (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Θέματα: Optical materials.; Electronic materials.; Semiconductors.; Electronic circuits.; Computers.; Optical and Electronic Materials.; Circuits and Systems.; Computation by Abstract Devices.; Electronic Circuits and Devices.

This book describes the physics of phase change memory devices, starting from basic operation to reliability issues. The book gives a comprehensive overlook of PCM with particular attention to the electrical transport and the phase transition physics between the two states. The book also contains de...

Πίνακας περιεχομένων:

• Chapter 1. Memory overview and PCM introduction
• Chapter 2.Electrical transport in crystalline and amorphous chalcogenides
• Chapter 3.Thermal model and remarkable temperature effects on calcogenide alloys
• Chapter 4.Self-consistent numerical model
• Chapter 5.PCM main reliability features
• Chapter 6.Structure and properties of chalcogenide materials for PCM
• Chapter 7.Material Engineering for PCM Device Optimization
• Chapter 8.PCM scaling
• Chapter 9.PCM device design
• Chapter 10.PCM array architecture and management
• Chapter 11. PCM applications and an outlook to the future.