Παραπομπή σε μορφή APA (7η εκδ.)

Sayil, S., & Sayil, S. (2018). Contactless VLSI Measurement and Testing Techniques (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-69673-7

Παραπομπή σε μορφή Chicago (17η εκδ.)

Sayil, Selahattin, και Selahattin Sayil. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-69673-7.

Παραπομπή σε μορφή MLA (8th εκδ.)

Sayil, Selahattin, και Selahattin Sayil. Contactless VLSI Measurement and Testing Techniques. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-69673-7.