Contactless VLSI Measurement and Testing Techniques

• Κύριος συγγραφέας: Sayil, Selahattin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Θέματα: Electronic circuits.; Microprocessors.; Electronics.; Microelectronics.; Circuits and Systems.; Processor Architectures.; Electronics and Microelectronics, Instrumentation.

This book provides readers with a comprehensive overview of the state-of-the-art in optical contactless probing approaches, in order to fill a gap in the literature on VLSI Testing.  The author highlights the inherent difficulties encountered with the mechanical probe and testability design approach...

Πίνακας περιεχομένων:

• 1. Conventional Test Methods. - 2. Testability Design
• 3. Other Techniques Based on the Contacting Probe
• 4. Contactless Testing
• 5. Electron-Beam and Photoemission Probing
• 6. Electro Optic Sampling and Charge Density Probe
• 7. Electric Force Microscope, Capacitive Coupling and Scanning Magneto-Resistive Probe
• 8. Probing Techniques Based on Light Emission from Chip
• 9. All Silicon Optical Technology for Contactless Testing of Integrated Circuits
• 10. Comparison of Contactless Testing Methodologies.