Kay, N. D., & Kay, N. D. (2018). Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-70181-3
Παραπομπή σε μορφή Chicago (17η εκδ.)Kay, Nicholas D., και Nicholas D. Kay. Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-70181-3.
Παραπομπή σε μορφή MLA (8th εκδ.)Kay, Nicholas D., και Nicholas D. Kay. Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals: A Scanning Probe Microscopy Approach. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-70181-3.
