Nanomechanical and Nanoelectromechanical Phenomena in 2D Atomic Crystals A Scanning Probe Microscopy Approach /

• Κύριος συγγραφέας: Kay, Nicholas D. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: Springer Theses, Recognizing Outstanding Ph.D. Research,
• Θέματα: Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Nanotechnology.; Spectroscopy.; Microscopy.; Nanoscale science.; Nanoscience.; Nanostructures.; Surface and Interface Science, Thin Films.; Spectroscopy and Microscopy.; Nanoscale Science and Technology.

This thesis introduces a unique approach of applying atomic force microscopy to study the nanoelectromechanical properties of 2D materials, providing high-resolution computer-generated imagery (CGI) and diagrams to aid readers' understanding and visualization. The isolation of graphene and, sho...

Πίνακας περιεχομένων:

• Introduction
• Background
• Materials and Methods
• Morphology of 2D Materials and their Heterostructures
• Nanomechanical Phenomena
• Nanoelectromechanical Phenomena
• Further Work and Future Directions
• Conclusion.