Lutz, J., Schlangenotto, H., Scheuermann, U., & De Doncker, R. (2018). Semiconductor Power Devices: Physics, Characteristics, Reliability (2nd ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-70917-8
Παραπομπή σε μορφή Chicago (17η εκδ.)Lutz, Josef, Heinrich Schlangenotto, Uwe Scheuermann, και Rik De Doncker. Semiconductor Power Devices: Physics, Characteristics, Reliability. 2nd ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-70917-8.
Παραπομπή σε μορφή MLA (8th εκδ.)Lutz, Josef, et al. Semiconductor Power Devices: Physics, Characteristics, Reliability. 2nd ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-70917-8.
