Παραπομπή σε μορφή APA (7η εκδ.)

Lienig, J., & Thiele, M. (2018). Fundamentals of Electromigration-Aware Integrated Circuit Design (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-73558-0

Παραπομπή σε μορφή Chicago (17η εκδ.)

Lienig, Jens, και Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-73558-0.

Παραπομπή σε μορφή MLA (8th εκδ.)

Lienig, Jens, και Matthias Thiele. Fundamentals of Electromigration-Aware Integrated Circuit Design. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-73558-0.