Fundamentals of Electromigration-Aware Integrated Circuit Design

• Κύριοι συγγραφείς: Lienig, Jens (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Thiele, Matthias (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Θέματα: Electronic circuits.; Microprocessors.; Electronics.; Microelectronics.; Circuits and Systems.; Electronic Circuits and Devices.; Processor Architectures.; Electronics and Microelectronics, Instrumentation.

The book provides a comprehensive overview of electromigration and its effects on the reliability of electronic circuits. It introduces the physical process of electromigration, which gives the reader the requisite understanding and knowledge for adopting appropriate counter measures. A comprehensiv...

Πίνακας περιεχομένων:

• Introduction
• Fundamentals of Electromigration
• Integrated Circuit Design and Electromigration
• Mitigating Electromigration in Physical Design
• Summary and Outlook.