Parasitic Substrate Coupling in High Voltage Integrated Circuits Minority and Majority Carriers Propagation in Semiconductor Substrate /

• Main Authors: Buccella, Pietro (Author, http://id.loc.gov/vocabulary/relators/aut), Stefanucci, Camillo (http://id.loc.gov/vocabulary/relators/aut), Kayal, Maher (http://id.loc.gov/vocabulary/relators/aut), Sallese, Jean-Michel (http://id.loc.gov/vocabulary/relators/aut)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Analog Circuits and Signal Processing,
• Subjects: Electronic circuits.; Electronics.; Microelectronics.; Circuits and Systems.; Electronic Circuits and Devices.; Electronics and Microelectronics, Instrumentation.

This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools. The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching...