Parasitic Substrate Coupling in High Voltage Integrated Circuits Minority and Majority Carriers Propagation in Semiconductor Substrate /

• Κύριοι συγγραφείς: Buccella, Pietro (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Stefanucci, Camillo (http://id.loc.gov/vocabulary/relators/aut), Kayal, Maher (http://id.loc.gov/vocabulary/relators/aut), Sallese, Jean-Michel (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: Analog Circuits and Signal Processing,
• Θέματα: Electronic circuits.; Electronics.; Microelectronics.; Circuits and Systems.; Electronic Circuits and Devices.; Electronics and Microelectronics, Instrumentation.

This book introduces a new approach to model and predict substrate parasitic failures in integrated circuits with standard circuit design tools. The injection of majority and minority carriers in the substrate is a recurring problem in smart power ICs containing high voltage, high current switching...

Πίνακας περιεχομένων:

• Chapter1: Overview of Parasitic Substrate Coupling
• Chapter2: Design Challenges in High Voltage ICs
• Chapter3: Substrate Modeling with Parasitic Transistors
• Chapter4: TCAD Validation of the Model
• Chapter5: Extraction Tool for the Substrate Network
• Chapter6: Parasitic Bipolar Transistors in Benchmark Structures
• Chapter7: Substrate Coupling Analysis and Evaluation of Protection Strategies.