Optical Characterization of Thin Solid Films

• Corporate Author: SpringerLink (Online service)
• Other Authors: Stenzel, Olaf (Editor, http://id.loc.gov/vocabulary/relators/edt), Ohlídal, Miloslav (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Springer Series in Surface Sciences, 64
• Subjects: Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Optical materials.; Electronic materials.; Spectroscopy.; Microscopy.; Materials science.; Materials-Surfaces.; Surface and Interface Science, Thin Films.; Optical and Electronic Materials.; Spectroscopy and Microscopy.; Characterization and Evaluation of Materials.; Surfaces and Interfaces, Thin Films.
• Physical Description: XXIV, 462 p. online resource.
• ISBN: 9783319753256
• ISSN: 0931-5195 ;
• DOI: 10.1007/978-3-319-75325-6

This book is an up-to-date survey of the major optical characterization techniques for thin solid films. Emphasis is placed on practicability of the various approaches. Relevant fundamentals are briefly reviewed before demonstrating the application of these techniques to practically relevant research and development topics. The book is written by international top experts, all of whom are involved in industrial research and development projects.