Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Fujiwara, Hiroyuki (Editor, http://id.loc.gov/vocabulary/relators/edt), Collins, Robert W. (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Springer Series in Optical Sciences, 212
• Subjects: Lasers.; Photonics.; Optical materials.; Electronic materials.; Microwaves.; Optical engineering.; Renewable energy resources.; Optics, Lasers, Photonics, Optical Devices.; Optical and Electronic Materials.; Microwaves, RF and Optical Engineering.; Renewable and Green Energy.
• Physical Description: XX, 594 p. 336 illus., 266 illus. in color. online resource.
• ISBN: 9783319753775
• ISSN: 0342-4111 ;
• DOI: 10.1007/978-3-319-75377-5

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.