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|a 9783319753775
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|a 10.1007/978-3-319-75377-5
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|a 621.36
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|a Spectroscopic Ellipsometry for Photovoltaics
|h [electronic resource] :
|b Volume 1: Fundamental Principles and Solar Cell Characterization /
|c edited by Hiroyuki Fujiwara, Robert W. Collins.
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|a 1st ed. 2018.
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|a Cham :
|b Springer International Publishing :
|b Imprint: Springer,
|c 2018.
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|a XX, 594 p. 336 illus., 266 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
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|a online resource
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|a text file
|b PDF
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|a Springer Series in Optical Sciences,
|x 0342-4111 ;
|v 212
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|a Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers.
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|a This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers.
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|a Lasers.
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|a Photonics.
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|a Optical materials.
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|a Electronic materials.
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|a Microwaves.
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|a Optical engineering.
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|a Renewable energy resources.
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|a Optics, Lasers, Photonics, Optical Devices.
|0 http://scigraph.springernature.com/things/product-market-codes/P31030
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|a Optical and Electronic Materials.
|0 http://scigraph.springernature.com/things/product-market-codes/Z12000
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|a Microwaves, RF and Optical Engineering.
|0 http://scigraph.springernature.com/things/product-market-codes/T24019
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|a Renewable and Green Energy.
|0 http://scigraph.springernature.com/things/product-market-codes/111000
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|a Fujiwara, Hiroyuki.
|e editor.
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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|a Collins, Robert W.
|e editor.
|4 edt
|4 http://id.loc.gov/vocabulary/relators/edt
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9783319753751
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|i Printed edition:
|z 9783319753768
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|a Springer Series in Optical Sciences,
|x 0342-4111 ;
|v 212
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|u https://doi.org/10.1007/978-3-319-75377-5
|z Full Text via HEAL-Link
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|a ZDB-2-PHA
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|a Physics and Astronomy (Springer-11651)
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