Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization /

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid per...

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Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Fujiwara, Hiroyuki (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Collins, Robert W. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
Έκδοση:1st ed. 2018.
Σειρά:Springer Series in Optical Sciences, 212
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 1 0 |a Spectroscopic Ellipsometry for Photovoltaics  |h [electronic resource] :  |b Volume 1: Fundamental Principles and Solar Cell Characterization /  |c edited by Hiroyuki Fujiwara, Robert W. Collins. 
250 |a 1st ed. 2018. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2018. 
300 |a XX, 594 p. 336 illus., 266 illus. in color.  |b online resource. 
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490 1 |a Springer Series in Optical Sciences,  |x 0342-4111 ;  |v 212 
505 0 |a Introduction -- Part I: Fundamental Principles of Ellipsometry -- Measurement Technique of Ellipsometry -- Data Analysis -- Optical Properties of Semiconductors -- Dielectric Function Modeling -- Effect of Roughness on Ellipsometry Analysis -- Part II: Characterization of Materials and Structures -- Ex-situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon -- Crystalline Silicon Solar Cells -- Amorphous/Crystalline Si Heterojunction Solar Cells -- Optical Properties of Cu(In,Ga)Se2 -- Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1-xGaxSe2 for Complex Dielectric Function Determination and Parameterization -- Cu2ZnSn(S,Se)4 and Related Materials -- Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics -- High Efficiency III-V Solar Cells -- Organic Solar Cells -- Organic-Inorganic Hybrid Perovskite Solar Cells -- Solar Cells with Photonic and Plasmonic Structures -- Transparent Conductive Oxide Materials -- High-Mobility Transparent Conductive Oxide Layers. 
520 |a This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid perovskites), fulfilling a critical need in the photovoltaic community. The book describes optical constants of a variety of semiconductor light absorbers, transparent conductive oxides and metals that are vital for the interpretation of solar cell characteristics and device simulations. It is divided into four parts: fundamental principles of ellipsometry; characterization of solar cell materials/structures; ellipsometry applications including optical simulations of solar cell devices and online monitoring of film processing; and the optical constants of solar cell component layers. 
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