Spectroscopic Ellipsometry for Photovoltaics Volume 1: Fundamental Principles and Solar Cell Characterization /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Fujiwara, Hiroyuki (Editor, http://id.loc.gov/vocabulary/relators/edt), Collins, Robert W. (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Springer Series in Optical Sciences, 212
• Subjects: Lasers.; Photonics.; Optical materials.; Electronic materials.; Microwaves.; Optical engineering.; Renewable energy resources.; Optics, Lasers, Photonics, Optical Devices.; Optical and Electronic Materials.; Microwaves, RF and Optical Engineering.; Renewable and Green Energy.

This book provides a basic understanding of spectroscopic ellipsometry, with a focus on characterization methods of a broad range of solar cell materials/devices, from traditional solar cell materials (Si, CuInGaSe2, and CdTe) to more advanced emerging materials (Cu2ZnSnSe4, organics, and hybrid per...