Ellipsometry of Functional Organic Surfaces and Films

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Hinrichs, Karsten (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Eichhorn, Klaus-Jochen (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 2nd ed. 2018.
• Σειρά: Springer Series in Surface Sciences, 52
• Θέματα: Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Materials-Surfaces.; Physical chemistry.; Lasers.; Photonics.; Materials science.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Physical Chemistry.; Optics, Lasers, Photonics, Optical Devices.; Characterization and Evaluation of Materials.

This new edition provides a state-of-the-art survey of ellipsometric methods used to study organic films and surfaces, from laboratory to synchrotron applications, with a special focus on in-situ use in processing environments and at solid-liquid interfaces. Thanks to the development of functional o...

Πίνακας περιεχομένων:

• Indtroduction
• Ellipsometry: A survey of Concept
• Biomolecules at surfaces
• Smart polymer surfaces and films
• Nanostructured surfaces and organic/inorganic hybrids
• Thin films of organic semiconductors for OPV, OLEDs and OTFT
• Developments in ellipsometric real-time/in-situ monitoring techniques
• Infrared spectroscopic methods for characterization of thin organic films
• Brillant infrared light sources for micro-ellipsometric studies of organic films
• Optical constants. .