Reliability Physics and Engineering Time-To-Failure Modeling /

• Κύριος συγγραφέας: McPherson, J. W. (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Έκδοση: 3rd ed. 2019.
• Θέματα: Electronic circuits.; Quality control.; Reliability.; Industrial safety.; Circuits and Systems.; Electronic Circuits and Devices.; Quality Control, Reliability, Safety and Risk.

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information con...

Πίνακας περιεχομένων:

• Introduction
• Physics of Degradation
• Time Dependence of Materials and Device Degradation
• From Material/Device Degradation to Time-To-Failure
• Time-To-Failure Modeling
• Gaussian Statistics - An Overview
• Time-To-Failure Statistics
• Failure Rate Modeling
• Accelerated Degradation
• Acceleration Factor Modeling
• Ramp-To-Failure Testing
• Time-To-Failure Models for Selected Failure Mechanisms in Integrated Circuits
• Time-To-Failure Models for Selected Failure Mechanisms in Mechanical Engineering
• Conversion of Dynamical Stresses Into Effective Static Values
• Resonance and Resonance-Induced Degradation
• Increasing the Reliability of Device/Product Designs
• Screening
• Heat Generation and Dissipation
• Sampling Plans and Confidence Intervals
• .