Reliability Physics and Engineering Time-To-Failure Modeling /

• Main Author: McPherson, J. W. (Author, http://id.loc.gov/vocabulary/relators/aut)
• Corporate Author: SpringerLink (Online service)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Edition: 3rd ed. 2019.
• Subjects: Electronic circuits.; Quality control.; Reliability.; Industrial safety.; Circuits and Systems.; Electronic Circuits and Devices.; Quality Control, Reliability, Safety and Risk.

This third edition textbook provides the basics of reliability physics and engineering that are needed by electrical engineers, mechanical engineers, civil engineers, biomedical engineers, materials scientists, and applied physicists to help them to build better devices/products. The information con...