Claeys, C., & Simoen, E. (2018). Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-93925-4
Παραπομπή σε μορφή Chicago (17η εκδ.)Claeys, Cor, και Eddy Simoen. Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-93925-4.
Παραπομπή σε μορφή MLA (8th εκδ.)Claeys, Cor, και Eddy Simoen. Metal Impurities in Silicon- and Germanium-Based Technologies: Origin, Characterization, Control, and Device Impact. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-93925-4.
