Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications and Optical Data of Solar Cell Materials /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Fujiwara, Hiroyuki (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Collins, Robert W. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 1st ed. 2018.
• Σειρά: Springer Series in Optical Sciences, 214
• Θέματα: Lasers.; Photonics.; Optical materials.; Electronic materials.; Spectroscopy.; Microscopy.; Renewable energy resources.; Microwaves.; Optical engineering.; Optics, Lasers, Photonics, Optical Devices.; Optical and Electronic Materials.; Spectroscopy and Microscopy.; Renewable and Green Energy.; Microwaves, RF and Optical Engineering.

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features...