Spectroscopic Ellipsometry for Photovoltaics Volume 2: Applications and Optical Data of Solar Cell Materials /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Fujiwara, Hiroyuki (Editor, http://id.loc.gov/vocabulary/relators/edt), Collins, Robert W. (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Springer Series in Optical Sciences, 214
• Subjects: Lasers.; Photonics.; Optical materials.; Electronic materials.; Spectroscopy.; Microscopy.; Renewable energy resources.; Microwaves.; Optical engineering.; Optics, Lasers, Photonics, Optical Devices.; Optical and Electronic Materials.; Spectroscopy and Microscopy.; Renewable and Green Energy.; Microwaves, RF and Optical Engineering.

Spectroscopic ellipsometry has been applied to a wide variety of material and device characterizations in solar cell research fields. In particular, device performance analyses using exact optical constants of component layers and direct analyses of complex solar cell structures are unique features...