Structural, Syntactic, and Statistical Pattern Recognition Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17-19, 2018, Proceedings /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Bai, Xiao (Editor, http://id.loc.gov/vocabulary/relators/edt), Hancock, Edwin R. (Editor, http://id.loc.gov/vocabulary/relators/edt), Ho, Tin Kam (Editor, http://id.loc.gov/vocabulary/relators/edt), Wilson, Richard C. (Editor, http://id.loc.gov/vocabulary/relators/edt), Biggio, Battista (Editor, http://id.loc.gov/vocabulary/relators/edt), Robles-Kelly, Antonio (Editor, http://id.loc.gov/vocabulary/relators/edt)
• Format: Electronic eBook
• Language: English
• Published: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Edition: 1st ed. 2018.
• Series: Image Processing, Computer Vision, Pattern Recognition, and Graphics ; 11004
• Subjects: Artificial intelligence.; Pattern recognition.; Optical data processing.; Algorithms.; Computer science-Mathematics.; Data structures (Computer science).; Artificial Intelligence.; Pattern Recognition.; Image Processing and Computer Vision.; Algorithm Analysis and Problem Complexity.; Discrete Mathematics in Computer Science.; Data Structures.

This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They wer...