Post-Silicon Validation and Debug

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Mishra, Prabhat (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt), Farahmandi, Farimah (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
• Έκδοση: 1st ed. 2019.
• Θέματα: Electronic circuits.; Microprocessors.; Electronics.; Microelectronics.; Circuits and Systems.; Processor Architectures.; Electronics and Microelectronics, Instrumentation.
• Φυσική περιγραφή: XV, 394 p. 189 illus., 113 illus. in color. online resource.
• ISBN: 9783319981161
• DOI: 10.1007/978-3-319-98116-1

This book provides a comprehensive coverage of System-on-Chip (SoC) post-silicon validation and debug challenges and state-of-the-art solutions with contributions from SoC designers, academic researchers as well as SoC verification experts. The readers will get a clear understanding of the existing debug infrastructure and how they can be effectively utilized to verify and debug SoCs. Provides a comprehensive overview of the SoC post-silicon validation and debug challenges; Covers state-of-the-art techniques for developing on-chip debug infrastructure; Describes automated techniques for generating post-silicon tests and assertions to enable effective post-silicon debug and coverage analysis; Covers scalable post-silicon validation and bug localization using a combination of simulation-based techniques and formal methods; Presents case studies for post-silicon debug of industrial SoC designs.