Ventura, S., & Luna, J. M. (2018). Supervised Descriptive Pattern Mining (1st ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-98140-6
Chicago Style (17th ed.) CitationVentura, Sebastián, and José María Luna. Supervised Descriptive Pattern Mining. 1st ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-98140-6.
MLA (8th ed.) CitationVentura, Sebastián, and José María Luna. Supervised Descriptive Pattern Mining. 1st ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-98140-6.
Warning: These citations may not always be 100% accurate.