Die-Attach Materials for High Temperature Applications in Microelectronics Packaging Materials, Processes, Equipment, and Reliability /

This book presents the scientific principles, processing conditions, probable failure mechanisms, and a description of reliability performance and equipment required for implementing high-temperature and lead-free die attach materials. In particular, it addresses the use of solder alloys, silver and...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Siow, Kim S. (Επιμελητής έκδοσης, http://id.loc.gov/vocabulary/relators/edt)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2019.
Έκδοση:1st ed. 2019.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
LEADER 04650nam a2200601 4500
001 978-3-319-99256-3
003 DE-He213
005 20191022021612.0
007 cr nn 008mamaa
008 190129s2019 gw | s |||| 0|eng d
020 |a 9783319992563  |9 978-3-319-99256-3 
024 7 |a 10.1007/978-3-319-99256-3  |2 doi 
040 |d GrThAP 
050 4 |a TA1750-1750.22 
072 7 |a TJFD  |2 bicssc 
072 7 |a TEC021020  |2 bisacsh 
072 7 |a TJFD  |2 thema 
082 0 4 |a 620.11295  |2 23 
082 0 4 |a 620.11297  |2 23 
245 1 0 |a Die-Attach Materials for High Temperature Applications in Microelectronics Packaging  |h [electronic resource] :  |b Materials, Processes, Equipment, and Reliability /  |c edited by Kim S. Siow. 
250 |a 1st ed. 2019. 
264 1 |a Cham :  |b Springer International Publishing :  |b Imprint: Springer,  |c 2019. 
300 |a XX, 279 p. 175 illus., 122 illus. in color.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
347 |a text file  |b PDF  |2 rda 
505 0 |a Chapter 1: Silver Sintering and Soldering: Bonding Process and Comparison -- Chapter 2: Sintered Silver for LED Applications -- Chapter 3: Process Control of Sintered Ag Joint in Production for Die-Attach Applications -- Chapter 4: Thermomechanical Modeling of High-Temperature Bonded Interface Materials -- Chapter 5: Reliability and Failure Mechanisms of Sintered Ag as Die Attach Joint -- Chapter6: Morphological changes in sintered silver due to atomic migration -- Chapter 7: Doctrine of Equivalents and Sintered Silver (Ag) Paste as Bonding Materials -- Chapter 8: Sintered Copper : Chemistry, Process and Reliability -- Chapter 9: Transient Liquid Phase Bonding -- Chapter 10: Die attach materials for extreme conditions and harsh environments. 
520 |a This book presents the scientific principles, processing conditions, probable failure mechanisms, and a description of reliability performance and equipment required for implementing high-temperature and lead-free die attach materials. In particular, it addresses the use of solder alloys, silver and copper sintering, and transient liquid-phase sintering. While different solder alloys have been used widely in the microelectronics industry, the implementation of sintering silver and transient liquid-phase sintering remains limited to a handful of companies. Hence, the book devotes many chapters to sintering technologies, while simultaneously providing only a cursory coverage of the more widespread techniques employing solder alloys. Addresses the differences between sintering and soldering (the current die-attach technologies), thereby comprehensively addressing principles, methods, and performance of these high-temperature die-attach materials; Emphasizes the industrial perspective, with chapters written by engineers who have hands-on experience using these technologies; Baker Hughes, Bosch and ON Semiconductor, are represented as well as materials suppliers such as Indium; Simultaneously provides the detailed science underlying these technologies by leading academic researchers in the field. 
650 0 |a Optical materials. 
650 0 |a Electronic materials. 
650 0 |a Electronics. 
650 0 |a Microelectronics. 
650 0 |a Metals. 
650 0 |a Materials science. 
650 0 |a Engineering-Materials. 
650 0 |a Quality control. 
650 0 |a Reliability. 
650 0 |a Industrial safety. 
650 1 4 |a Optical and Electronic Materials.  |0 http://scigraph.springernature.com/things/product-market-codes/Z12000 
650 2 4 |a Electronics and Microelectronics, Instrumentation.  |0 http://scigraph.springernature.com/things/product-market-codes/T24027 
650 2 4 |a Metallic Materials.  |0 http://scigraph.springernature.com/things/product-market-codes/Z16000 
650 2 4 |a Characterization and Evaluation of Materials.  |0 http://scigraph.springernature.com/things/product-market-codes/Z17000 
650 2 4 |a Materials Engineering.  |0 http://scigraph.springernature.com/things/product-market-codes/T28000 
650 2 4 |a Quality Control, Reliability, Safety and Risk.  |0 http://scigraph.springernature.com/things/product-market-codes/T22032 
700 1 |a Siow, Kim S.  |e editor.  |4 edt  |4 http://id.loc.gov/vocabulary/relators/edt 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783319992556 
776 0 8 |i Printed edition:  |z 9783319992570 
856 4 0 |u https://doi.org/10.1007/978-3-319-99256-3  |z Full Text via HEAL-Link 
912 |a ZDB-2-CMS 
950 |a Chemistry and Materials Science (Springer-11644)