Breitenstein, O., Warta, W., & Schubert, M. C. (2018). Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials (3rd ed. 2018.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-319-99825-1
Παραπομπή σε μορφή Chicago (17η εκδ.)Breitenstein, Otwin, Wilhelm Warta, και Martin C. Schubert. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. 3rd ed. 2018. Cham: Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-99825-1.
Παραπομπή σε μορφή MLA (8th εκδ.)Breitenstein, Otwin, et al. Lock-in Thermography: Basics and Use for Evaluating Electronic Devices and Materials. 3rd ed. 2018. Springer International Publishing : Imprint: Springer, 2018. https://doi.org/10.1007/978-3-319-99825-1.
