Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

• Κύριοι συγγραφείς: Breitenstein, Otwin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Warta, Wilhelm (http://id.loc.gov/vocabulary/relators/aut), Schubert, Martin C. (http://id.loc.gov/vocabulary/relators/aut)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
• Έκδοση: 3rd ed. 2018.
• Σειρά: Springer Series in Advanced Microelectronics, 10
• Θέματα: Lasers.; Photonics.; Materials science.; Microwaves.; Optical engineering.; Structural materials.; Optics, Lasers, Photonics, Optical Devices.; Characterization and Evaluation of Materials.; Microwaves, RF and Optical Engineering.; Structural Materials.

 This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signal-to-noise ratio (up to 1000x) and a far better lateral resolution compared to steady-state thermography. Reviewing various experimental approaches to LIT, particularly the commercial LIT systems available, this 3rd edition introduces new LIT applications, such as illuminated LIT applied to solar cells, non-thermal LIT lifetime mapping and LIT application to spin caloritronics problems. Numerous LIT investigation case studies are also included. 

 Introduction -- Physical and Technical Basics -- Experimental Technique -- Theory -- Measurement Strategies -- Typical Applications -- Summary and Outlook. .