Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /
This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...
Κύριοι συγγραφείς: | , , |
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Συγγραφή απο Οργανισμό/Αρχή: | |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Cham :
Springer International Publishing : Imprint: Springer,
2018.
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Έκδοση: | 3rd ed. 2018. |
Σειρά: | Springer Series in Advanced Microelectronics,
10 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
Πίνακας περιεχομένων:
- Introduction
- Physical and Technical Basics
- Experimental Technique
- Theory
- Measurement Strategies
- Typical Applications
- Summary and Outlook. .