Lock-in Thermography Basics and Use for Evaluating Electronic Devices and Materials /

This book discusses lock-in thermography (LIT) as a dynamic variant of the widely known IR thermography. It focuses on applications to electronic devices and materials, but also includes chapters addressing non-destructive evaluation. Periodically modulating heat sources allows a much-improved signa...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Κύριοι συγγραφείς: Breitenstein, Otwin (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut), Warta, Wilhelm (http://id.loc.gov/vocabulary/relators/aut), Schubert, Martin C. (http://id.loc.gov/vocabulary/relators/aut)
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Cham : Springer International Publishing : Imprint: Springer, 2018.
Έκδοση:3rd ed. 2018.
Σειρά:Springer Series in Advanced Microelectronics, 10
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
Πίνακας περιεχομένων:
  • Introduction
  • Physical and Technical Basics
  • Experimental Technique
  • Theory
  • Measurement Strategies
  • Typical Applications
  • Summary and Outlook. .