Applied Scanning Probe Methods III Characterization /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Bhushan, Bharat (Editor), Fuchs, Harald (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
• Series: NanoScience and Technology,
• Subjects: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

The Nobel Prize of 1986 on Sc- ning Tunneling Microscopy sig- led a new era in imaging. The sc- ning probes emerged as a new i- trument for imaging with a pre- sion suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scop...

Table of Contents:

• Atomic Force Microscopy in Nanomedicine
• Scanning Probe Microscopy: From Living Cells to the Subatomic Range
• Surface Characterization and Adhesion and Friction Properties of Hydrophobic Leaf Surfaces and Nanopatterned Polymers for Superhydrophobic Surfaces
• Probing Macromolecular Dynamics and the Influence of Finite Size Effects
• Investigation of Organic Supramolecules by Scanning Probe Microscopy in Ultra-High Vacuum
• One- and Two-Dimensional Systems: Scanning Tunneling Microscopy and Spectroscopy of Organic and Inorganic Structures
• Scanning Probe Microscopy Applied to Ferroelectric Materials
• Morphological and Tribological Characterization of Rough Surfaces by Atomic Force Microscopy
• AFM Applications for Contact and Wear Simulation
• AFM Applications for Analysis of Fullerene-Like Nanoparticles
• Scanning Probe Methods in the Magnetic Tape Industry.