Applied Scanning Probe Methods II Scanning Probe Microscopy Techniques /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Bhushan, Bharat (Επιμελητής έκδοσης), Fuchs, Harald (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
• Σειρά: NanoScience and Technology,
• Θέματα: Engineering.; Polymers.; Surfaces (Physics).; Interfaces (Physical sciences).; Thin films.; Spectroscopy.; Microscopy.; Nanotechnology.; Materials > Surfaces.; Nanotechnology and Microengineering.; Spectroscopy and Microscopy.; Surface and Interface Science, Thin Films.; Surfaces and Interfaces, Thin Films.; Polymer Sciences.

The Nobel Prize of 1986 on Sc- ningTunnelingMicroscopysignaled a new era in imaging. The sc- ning probes emerged as a new - strument for imaging with a p- cision suf?cient to delineate single atoms. At ?rst there were two – the Scanning Tunneling Microscope, or STM, and the Atomic Force Mic- scope,...

Πίνακας περιεχομένων:

• Higher Harmonics in Dynamic Atomic Force Microscopy
• Atomic Force Acoustic Microscopy
• Scanning Ion Conductance Microscopy
• Spin-Polarized Scanning Tunneling Microscopy
• Dynamic Force Microscopy and Spectroscopy
• Sensor Technology for Scanning Probe Microscopy and New Applications
• Quantitative Nanomechanical Measurements in Biology
• Scanning Microdeformation Microscopy: Subsurface Imaging and Measurement of Elastic Constants at Mesoscopic Scale
• Electrostatic Force and Force Gradient Microscopy: Principles, Points of Interest and Application to Characterisation of Semiconductor Materials and Devices
• Polarization-Modulation Techniques in Near-Field Optical Microscopy for Imaging of Polarization Anisotropy in Photonic Nanostructures
• Focused Ion Beam as a Scanning Probe: Methods and Applications.