APA (7th ed.) Citation

Rein, S. (2005). Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer Berlin Heidelberg.

Chicago Style (17th ed.) Citation

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Berlin, Heidelberg: Springer Berlin Heidelberg, 2005.

MLA (8th ed.) Citation

Rein, Stefan. Lifetime Spectroscopy: A Method of Defect Characterization in Silicon for Photovoltaic Applications. Springer Berlin Heidelberg, 2005.

Warning: These citations may not always be 100% accurate.