Fringe 2005 The 5th International Workshop on Automatic Processing of Fringe Patterns /

The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for St...

Πλήρης περιγραφή

Λεπτομέρειες βιβλιογραφικής εγγραφής
Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
Άλλοι συγγραφείς: Osten, Wolfgang (Επιμελητής έκδοσης)
Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
Γλώσσα:English
Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2006.
Θέματα:
Διαθέσιμο Online:Full Text via HEAL-Link
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245 1 0 |a Fringe 2005  |h [electronic resource] :  |b The 5th International Workshop on Automatic Processing of Fringe Patterns /  |c edited by Wolfgang Osten. 
264 1 |a Berlin, Heidelberg :  |b Springer Berlin Heidelberg,  |c 2006. 
300 |a XVIII, 714 p.  |b online resource. 
336 |a text  |b txt  |2 rdacontent 
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505 0 |a Key Note -- New Methods and Tools for Data Processing -- Resolution Enhanced Technologies -- Wide Scale 4D Optical Metrology -- Hybrid Measurement Technologies -- New Optical Sensors and Measurement Systems. 
520 |a The purpose of the Fringe Proceedings is to present to engineers, scientists and industrial experts the state-of-the-art and the impact of Computer aided Evaluation in Structured Light Techniques, Holographic Interferometry, Classic Interferometry, Speckle Metrology, Moiré and Grid Techniques for Stress Analysis, Nondestructive Testing, Shape Measurement, Fault Detection, Quality Control and related fields. Topics of particular interest are: Advanced Computer Aided Measurement Techniques; Resolution Enhanced Technologies in Optical Metrology; New approaches in Wide Scale 4D Optical Metrology; Sophisticated Sensors Systems and their applications for the solution of challenging measurement problems. Special emphasis is put on modern Measurement Strategies taking into account the active combination of Physical Modeling, Computer Aided Simulation and Experimental Data Acquisition. Further attention is directed to new approaches for the Extension of Existing Resolution Limits that open the gates to Wide Scale Metrology ranging from nano to macro by using Advanced Optical Sensor Systems. . 
650 0 |a Engineering. 
650 0 |a Optics. 
650 0 |a Optoelectronics. 
650 0 |a Plasmons (Physics). 
650 0 |a Control engineering. 
650 0 |a Robotics. 
650 0 |a Mechatronics. 
650 0 |a Manufacturing industries. 
650 0 |a Machines. 
650 0 |a Tools. 
650 0 |a Quality control. 
650 0 |a Reliability. 
650 0 |a Industrial safety. 
650 1 4 |a Engineering. 
650 2 4 |a Quality Control, Reliability, Safety and Risk. 
650 2 4 |a Manufacturing, Machines, Tools. 
650 2 4 |a Optics, Optoelectronics, Plasmonics and Optical Devices. 
650 2 4 |a Control, Robotics, Mechatronics. 
700 1 |a Osten, Wolfgang.  |e editor. 
710 2 |a SpringerLink (Online service) 
773 0 |t Springer eBooks 
776 0 8 |i Printed edition:  |z 9783540260370 
856 4 0 |u http://dx.doi.org/10.1007/3-540-29303-5  |z Full Text via HEAL-Link 
912 |a ZDB-2-ENG 
950 |a Engineering (Springer-11647)