Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques /

• Κύριος συγγραφέας: Verma, H. R. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007.
• Θέματα: Physics.; Analytical chemistry.; Atoms.; Condensed matter.; Physical measurements.; Measurement.; Materials science.; Measurement Science and Instrumentation.; Analytical Chemistry.; Characterization and Evaluation of Materials.; Atomic, Molecular, Optical and Plasma Physics.; Condensed Matter Physics.
• Φυσική περιγραφή: XIV, 376 p. 128 illus. online resource.
• ISBN: 9783540302797

This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray Emission Analysis (PIXE), Rutherford Backscattering Analysis (RBS), Elastic Recoil Detection (ERD), Nuclear Reaction Analysis (NRA), Particle Induced Gamma-ray Emission Analysis (PIGE), and Accelerator Mass Spectrometry (AMS). These techniques are commonly applied in the fields of medicine, biology, environmental studies, archaeology or geology et al. and pursued in major international research laboratories.