Atomic and Nuclear Analytical Methods XRF, Mössbauer, XPS, NAA and B63Ion-Beam Spectroscopic Techniques /

• Κύριος συγγραφέας: Verma, H. R. (Συγγραφέας)
• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007.
• Θέματα: Physics.; Analytical chemistry.; Atoms.; Condensed matter.; Physical measurements.; Measurement.; Materials science.; Measurement Science and Instrumentation.; Analytical Chemistry.; Characterization and Evaluation of Materials.; Atomic, Molecular, Optical and Plasma Physics.; Condensed Matter Physics.

This book is a blend of analytical methods based on the phenomenon of atomic and nuclear physics. It comprises comprehensive presentations about X-ray Fluorescence (XRF), Mössbauer Spectroscopy (MS), X-ray Photoelectron Spectroscopy (XPS), Neutron- Activation Analysis (NAA), Particle Induced X-ray E...

Πίνακας περιεχομένων:

• X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE)
• Rutherford Backscattering Spectroscopy
• Elastic Recoil Detection
• Mössbauer Spectroscopy (MS)
• X-Ray Photoelectron Spectroscopy
• Neutron Activation Analysis
• Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission
• Accelerator Mass Spectrometry (AMS).