Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Cullis, A. G. (Επιμελητής έκδοσης), Hutchison, J. L. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
• Σειρά: Springer Proceedings in Physics, 107
• Θέματα: Materials science.; Solid state physics.; Physical measurements.; Measurement.; Spectroscopy.; Microscopy.; Electronics.; Microelectronics.; Electronic circuits.; Materials Science.; Materials Science, general.; Electronics and Microelectronics, Instrumentation.; Circuits and Systems.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.
• Φυσική περιγραφή: XVI, 540 p. online resource.
• ISBN: 9783540319153
• ISSN: 0930-8989 ;

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of the structural and electronic properties of semiconducting materials by the application of transmission and scanning electron microscopy. The latest developments in the use of other important microcharacterisation techniques were also covered and included the latest work using scanning probe microscopy and also X-ray topography and diffraction. Developments in materials science and technology covering the complete range of elemental and compound semiconductors are described in this volume.