Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK /

• Corporate Author: SpringerLink (Online service)
• Other Authors: Cullis, A. G. (Editor), Hutchison, J. L. (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
• Series: Springer Proceedings in Physics, 107
• Subjects: Materials science.; Solid state physics.; Physical measurements.; Measurement.; Spectroscopy.; Microscopy.; Electronics.; Microelectronics.; Electronic circuits.; Materials Science.; Materials Science, general.; Electronics and Microelectronics, Instrumentation.; Circuits and Systems.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...