Microscopy of Semiconducting Materials Proceedings of the 14th Conference, April 11–14, 2005, Oxford, UK /

• Συγγραφή απο Οργανισμό/Αρχή: SpringerLink (Online service)
• Άλλοι συγγραφείς: Cullis, A. G. (Επιμελητής έκδοσης), Hutchison, J. L. (Επιμελητής έκδοσης)
• Μορφή: Ηλεκτρονική πηγή Ηλ. βιβλίο
• Γλώσσα: English
• Έκδοση: Berlin, Heidelberg : Springer Berlin Heidelberg, 2005.
• Σειρά: Springer Proceedings in Physics, 107
• Θέματα: Materials science.; Solid state physics.; Physical measurements.; Measurement.; Spectroscopy.; Microscopy.; Electronics.; Microelectronics.; Electronic circuits.; Materials Science.; Materials Science, general.; Electronics and Microelectronics, Instrumentation.; Circuits and Systems.; Solid State Physics.; Spectroscopy and Microscopy.; Measurement Science and Instrumentation.

This is a long-established international biennial conference series, organised in conjunction with the Royal Microscopical Society, Oxford, the Institute of Physics, London and the Materials Research Society, USA. The 14th conference in the series focused on the most recent advances in the study of...

Πίνακας περιεχομένων:

• Epitaxy: Wide Band-Gap Nitrides
• Epitaxy: Silicon-Germanium Alloys
• Epitaxy: Growth and Defect Phenomena
• High Resolution Microscopy and Nanoanalysis
• Self-Organised and Quantum Domain Structures
• Processed Silicon and Other Device Materials
• Device Studies
• Scanning Electron and Scanning Probe Advances.