Roadmap of Scanning Probe Microscopy

• Corporate Author: SpringerLink (Online service)
• Other Authors: Morita, Seizo (Editor)
• Format: Electronic eBook
• Language: English
• Published: Berlin, Heidelberg : Springer Berlin Heidelberg, 2007.
• Series: NanoScience and Technology,
• Subjects: Materials science.; Condensed matter.; Engineering.; Nanotechnology.; Materials > Surfaces.; Thin films.; Materials Science.; Condensed Matter Physics.; Engineering, general.; Surfaces and Interfaces, Thin Films.

Scanning tunneling microscopy - with its applications that span not only atomic resolution but also scanning tunneling spectroscopy, atom/molecule manipulation and nanostructuring, and inelastic electron tunneling spectroscopy - has achieved remarkable progress and become the key technology for surf...

Table of Contents:

• Science and Technology in the Twenty-First Century
• Scanning Tunneling Microscopy
• Atomic Force Microscopy
• Near-Field Scanning Optical Microscope
• Scanning Capacitance Microscope
• Electrostatic Force Microscopy
• Magnetic Force Microscope
• STM-Induced Photon Emission Spectroscopy
• Scanning Atom Probe
• Chemical Discrimination of Atoms and Molecules
• Manipulation of Atoms and Molecules
• Multiprobe SPM
• AFM Measurement in Liquid
• High-Speed SPM
• Scanning Nonlinear Dielectric Microscope
• SPM Coupled with External Fields
• Probe Technology
• Characterization of Semiconducting Materials
• Evaluation of SPM for LSI Devices
• SPM Characterization of Catalysts
• SPM Characterization of Biomaterials
• SPM Characterization of Organic and Polymeric Materials
• Theories of SPM
• When Will SPM Realize Our Dreams? The Roadmap of SPM.