APA (7th ed.) Citation

Rosenauer, A., & Rosenauer, A. (2003). Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (1st ed. 2003.). Springer Berlin Heidelberg : Imprint: Springer. https://doi.org/10.1007/3-540-36407-2

Chicago Style (17th ed.) Citation

Rosenauer, Andreas, and Andreas Rosenauer. Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State. 1st ed. 2003. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2003. https://doi.org/10.1007/3-540-36407-2.

MLA (8th ed.) Citation

Rosenauer, Andreas, and Andreas Rosenauer. Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State. 1st ed. 2003. Springer Berlin Heidelberg : Imprint: Springer, 2003. https://doi.org/10.1007/3-540-36407-2.