Rosenauer, A., & Rosenauer, A. (2003). Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State (1st ed. 2003.). Springer Berlin Heidelberg : Imprint: Springer. https://doi.org/10.1007/3-540-36407-2
Παραπομπή σε μορφή Chicago (17η εκδ.)Rosenauer, Andreas, και Andreas Rosenauer. Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State. 1st ed. 2003. Berlin, Heidelberg: Springer Berlin Heidelberg : Imprint: Springer, 2003. https://doi.org/10.1007/3-540-36407-2.
Παραπομπή σε μορφή MLA (8th εκδ.)Rosenauer, Andreas, και Andreas Rosenauer. Transmission Electron Microscopy of Semiconductor Nanostructures: An Analysis of Composition and Strain State. 1st ed. 2003. Springer Berlin Heidelberg : Imprint: Springer, 2003. https://doi.org/10.1007/3-540-36407-2.
