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04121nam a2200589 4500 |
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978-3-540-36407-8 |
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DE-He213 |
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20191022151346.0 |
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|a 9783540364078
|9 978-3-540-36407-8
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|a 10.1007/3-540-36407-2
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|a QC173.45-173.458
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|a 530.41
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|a Rosenauer, Andreas.
|e author.
|4 aut
|4 http://id.loc.gov/vocabulary/relators/aut
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|a Transmission Electron Microscopy of Semiconductor Nanostructures
|h [electronic resource] :
|b An Analysis of Composition and Strain State /
|c by Andreas Rosenauer.
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| 250 |
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|a 1st ed. 2003.
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|a Berlin, Heidelberg :
|b Springer Berlin Heidelberg :
|b Imprint: Springer,
|c 2003.
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| 300 |
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|a XII, 241 p. 233 illus., 47 illus. in color.
|b online resource.
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|a text
|b txt
|2 rdacontent
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|a computer
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|2 rdamedia
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|a online resource
|b cr
|2 rdacarrier
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|a text file
|b PDF
|2 rda
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|a Springer Tracts in Modern Physics,
|x 0081-3869 ;
|v 182
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| 505 |
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|a Theoretical Fundamentals of Transmission Electron Microscopy -- Electron Diffraction -- Image Formation -- Digital Image Analysis -- Strain State Analysis -- Lattice Fringe Analysis -- Applications -- In0.6Ga0.4As/GaAs(001) SK Layers -- InAs Quantum Dots -- Electron Holography: AlAs/GaAs Superlattices -- Outlook.
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|a This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods including strain state analysis as well as evaluation of the composition via the lattice fringe analysis (CELFA) technique. The basics of these procedures as well as their advantages, drawbacks and sources of error are all discussed. The techniques are applied to quantum wells and dots in order to give insight into kinetic growth effects such as segregation and migration. In the first part of the book the fundamentals of transmission electron microscopy are provided. These are needed for an understanding of the digital image analysis techniques described in the second part of the book. There the reader will find information on different methods of composition determination. The third part of the book focuses on applications such as composition determination in InGaAs Stranski--Krastanov quantum dots. Finally it is shown how an improvement in the precision of the composition evaluation can be obtained by combining CELFA with electron holography. This is demonstrated for an AlAs/GaAs superlattice.
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|a Condensed matter.
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|a Solid state physics.
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|a Spectroscopy.
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|a Microscopy.
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|a Physical measurements.
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|a Measurement .
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|a Materials science.
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|a Condensed Matter Physics.
|0 http://scigraph.springernature.com/things/product-market-codes/P25005
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|a Solid State Physics.
|0 http://scigraph.springernature.com/things/product-market-codes/P25013
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|a Spectroscopy and Microscopy.
|0 http://scigraph.springernature.com/things/product-market-codes/P31090
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|a Measurement Science and Instrumentation.
|0 http://scigraph.springernature.com/things/product-market-codes/P31040
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|a Characterization and Evaluation of Materials.
|0 http://scigraph.springernature.com/things/product-market-codes/Z17000
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|a SpringerLink (Online service)
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|t Springer eBooks
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|i Printed edition:
|z 9783662146187
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|i Printed edition:
|z 9783662146170
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|i Printed edition:
|z 9783540004141
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| 830 |
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|a Springer Tracts in Modern Physics,
|x 0081-3869 ;
|v 182
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| 856 |
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|u https://doi.org/10.1007/3-540-36407-2
|z Full Text via HEAL-Link
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|a ZDB-2-PHA
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|a ZDB-2-BAE
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| 950 |
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|a Physics and Astronomy (Springer-11651)
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