Transmission Electron Microscopy of Semiconductor Nanostructures An Analysis of Composition and Strain State /
This book provides tools well suited for the quantitative investigation of semiconductor electron microscopy. These tools allow for the accurate determination of the composition of ternary semiconductor nanostructures with a spatial resolution at near atomic scales. The book focuses on new methods i...
Κύριος συγγραφέας: | Rosenauer, Andreas (Συγγραφέας, http://id.loc.gov/vocabulary/relators/aut) |
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Συγγραφή απο Οργανισμό/Αρχή: | SpringerLink (Online service) |
Μορφή: | Ηλεκτρονική πηγή Ηλ. βιβλίο |
Γλώσσα: | English |
Έκδοση: |
Berlin, Heidelberg :
Springer Berlin Heidelberg : Imprint: Springer,
2003.
|
Έκδοση: | 1st ed. 2003. |
Σειρά: | Springer Tracts in Modern Physics,
182 |
Θέματα: | |
Διαθέσιμο Online: | Full Text via HEAL-Link |
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